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Thermal-Humidity Test Chamber

Thermal-Humidity Test Chamber

  • Double 85 Constant Temperature And Humidity Reliability Environmental Test (THB) Double 85 Constant Temperature And Humidity Reliability Environmental Test (THB)
    Jan 07, 2024
    Double 85 Constant Temperature And Humidity Reliability Environmental Test (THB) First, high temperature and humidity test WHTOL (Wet High Temperature Operating Life) is a common environmental stress acceleration test, usually 85℃ and 85% relative humidity, which is generally carried out in accordance with the standard IEC 60068-2-67-2019. The test conditions are shown in the chart. Second, the test principle "Double 85 test" is one of the reliability environmental tests, mainly used for constant temperature and humidity box, that is, the temperature of the box is set to 85℃, the relative humidity is set to 85%RH conditions, to accelerate the aging of the test product. Although the test process is simple, the test is an important method to evaluate many characteristics of the test product, so it has become an indispensable reliability environmental test condition in various industries. After aging the product under the condition of 85℃/85%RH, compare the performance changes of the product before and after aging, such as the photoelectric performance parameters of the lamp, the mechanical properties of the material, yellow index, etc., the smaller the difference, the better, so as to test the heat and moisture resistance of the product. The product may have thermal failure when working in a continuous high temperature environment, and some moisture sensitive devices will fail in a high humidity environment. The dual 85 test can test the thermal stress generated by the product under high humidity and its ability to resist long-term moisture penetration. For example, the frequent failure of various products in the humid weather period in the south is mainly due to the poor temperature and humidity resistance of the products. 3. Experimental factors In the LED lighting industry, many manufacturers have used the double 85 test results as an important means to judge the quality of lamps. Various possible reasons why LED lamps fail the dual 85 test are: 1. Lamp power supply: poor heat resistance of shell, danger of short circuit in circuit, failure of protection mechanism, etc. 2. Lamp structure: unreasonable design of heat dissipation body, installation problems, materials are not resistant to high temperature. 3. Lamp light source: poor moisture resistance, packaging adhesive aging, high temperature resistance. If you encounter a special use environment, such as the working environment temperature is severe, you need to test its high and low temperature resistance, the test method can refer to the high and low temperature test project. 4. Serve customers 01. Customer group LED lighting factory, LED power plant, LED packaging factory 02. Means of detection Constant temperature and humidity test chamber 03. Reference standards Constant temperature and humidity tests for electrical and electronic products -- Environmental testing -- Part 2: Test methods -- Test Cab: Constant temperature and humidity test GB/T 2423.3-2006. 04. Service content 4.1 Refer to the standard, conduct double 85 test on the product, and provide the third party's test results report. 4.2 Provide the analysis and improvement plan of the product through the double 85 test.
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  • Reliability Test Reliability Test
    Jan 07, 2024
    Reliability Test AEC-Q102 Test Certification Fixed Damp Heat with Humidity Cycling (FMG), LED lamp reliability test method (GB/T 33721-2017), Component screening Ammonia test CAF test, Flame retardant grade Cyclic corrosion test (CCT), Mechanical shock test, High pressure cooker test (PCT), Highly Accelerated Stress Testing (HAST), High and low temperature and humidity test (THB), Hydrogen sulfide test (H2S), Liquid tank thermal shock test (TMSK), Component humidity sensitive grade test (MSL), Screening for high reliability use Hot flash test + acoustic sweep screening for high reliability use (MSL+SAT), LED luminaires reliability test scheme, Vibration test (VVF), Temperature cycle/thermal shock test (TC/TS), LED red Ink test UV aging test, LED light source anti-vulcanization test, Double 85 constant temperature and humidity reliability environmental test (THB), Salt spray test check.
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  • Tablet Reliability Test Tablet Reliability Test
    Oct 16, 2024
    Tablet Reliability Test A Tablet Computer, also known as a Tablet Personal Computer (Tablet PC), is a small, portable personal computer that uses a touch screen as its basic input device. It is an electronic product with strong mobility, and it can be seen everywhere in life (such as waiting stations, trains, high-speed trains, cafes, restaurants, meeting rooms, suburbs, etc.). People carry only simple coat protection or even no, in order to facilitate use, the design reduces the size, so that it can be directly placed in the pocket or handbag, backpack, but the tablet computer in the process of moving will also experience many environmental physical changes (such as temperature, humidity, vibration, impact, extrusion, etc.). Etc.) and natural damage (such as ultraviolet light, sunlight, dust, salt spray, water droplets... It will also cause artificial unintentional injury or abnormal operation and misoperation, and even cause failure and damage (such as: household chemicals, hand sweating, falling, terminal insertion and removal too much, pocket friction, crystal nails... These will shorten the life of the tablet computer, in order to ensure the reliability of the product and extend the service life to improve, we must carry out a number of environmental reliability test projects on the tablet computer, the following relevant tests for your reference. Environmental test project description: Simulate various harsh environments and reliability assessments used by tablet computers to test whether their performance meets the requirements; It mainly includes high and low temperature operation and high and low temperature storage, temperature and condensation, temperature cycle and shock, wet and heat combination test, ultraviolet, sunlight, drip, dust, salt spray and other tests. Operating temperature range: 0℃ ~ 35℃/5% ~ 95%RH Storage temperature range: -10℃ ~ 50℃/10% ~ 90%RH Operating low temperature test: -10℃/2h/ power operation Operating high temperature test: 40℃/8h/ all running Storage low temperature test: -20℃/96h/ shutdown Storage high temperature test: 60℃/96h/ shutdown High temperature test of vehicle storage: 85℃/96h/ shutdown Temperature shock: -40℃(30min)←→80℃(30min)/10cycle Wet heat test: 40℃/95%R.H./48h/ power standby Hot and humid cycle test: 40℃/95%R.H./1h→ramp:1℃/min→-10℃/1h, 20cycles, power standby Wet heat test: 40℃/95%R.H./48h/ power standby Hot and humid cycle test: 40℃/95%R.H./1h→ramp:1℃/min→-10℃/1h, 20cycles, power standby Weather resistance test: Simulation of the most severe natural conditions, solar thermal effect test, each cycle of 24 hours, 8 hours of continuous exposure, 16 hours to keep dark, each cycle radiation amount of 8.96 kWh/m2, a total of 10cycles. Salt spray test: 5% sodium chloride solution/Water temperature 35°C/PH 6.5~7.2/24h/ Shutdown → Pure water wipe shell →55°C/0.5h→ Function test: after 2 hours, after 40/80%R.H./168h. Dripping test: According to IEC60529, in line with IPX2 waterproof rating, can prevent water droplets falling at an Angle of less than 15 degrees from entering the tablet computer and causing damage. Test conditions: water flow rate 3mm/min, 2.5min at each position, checkpoint: after test, 24 hours later, standby for 1 week. Dust Test: According to IEC60529, in line with the IP5X dust class, can not completely prevent the entry of dust but does not affect the device should be the action and anquan, in addition to tablet computers are currently many personal mobile portable 3C products commonly used dust standards, such as: mobile phones, digital cameras, MP3, MP4... Let's wait. Conditions: Dust sample 110mm/3 ~ 8h/ test for dynamic operation After the test, a microscope is used to detect whether dust particles will enter the interior space of the tablet. Chemical staining test: Confirm the external components related to the tablet, confirm the chemical resistance of household chemicals, chemicals: sunscreen, lipstick, hand cream, mosquito repellent, cooking oil (salad oil, sunflower oil, olive oil... Etc.), the test time is 24 hours, check the color, gloss, surface smoothness... Etc., and confirm whether there are bubbles or cracks. Mechanical test: Test the strength of the mechanical structure of the tablet computer and the wear resistance of the key components; Mainly includes vibration test, drop test, impact test, plug test, and wear test... Etc. Fall test: The height of 130cm, free fall on the smooth soil surface, each side fell 7 times, 2 sides a total of 14 times, tablet computer in standby state, each fall, the function of the test product is checked. Repeated drop test: the height of 30cm, free drop on the smooth dense surface of 2cm thickness, each side fell 100 times, each interval of 2s, 7 sides a total of 700 times, every 20 times, check the function of the experimental product, tablet computer is in the state of power. Random vibration test: frequency 30 ~ 100Hz, 2G, axial: three axial. Time: 1 hour in each direction, for a total of three hours, the tablet is in standby mode. Screen impact resistance test: 11φ/5.5g copper ball fell on the center surface of 1m object at 1.8m height and 3ψ/9g stainless steel ball fell at 30cm height Screen writing durability: more than 100,000 words (width R0.8mm, pressure 250g) Screen touch durability: 1 million, 10 million, 160 million, 200 million times or more (width R8mm, hardness 60°, pressure 250g, 2 times per second) Screen flat press test: the diameter of the rubber block is 8mm, the pressure speed is 1.2mm/min, the vertical direction is 5kg force flat press the window 3 times, each time for 5 seconds, the screen should display normally. Screen front flat press test: The entire contact area, the direction of the vertical 25kg force front flat press each side of the tablet computer, for 10 seconds, flat press 3 times, there should be no abnormal. Earphone plug and remove test: Insert the earphone vertically into the earphone hole, and then pull it out vertically. Repeat this for more than 5000 times I/O plug and pull test: The tablet is in standby state, and the plug terminal connector is pulled out, a total of more than 5000 times Pocket friction test: Simulate various materials pocket or backpack, the tablet is repeatedly rubbed in the pocket 2,000 times (friction test will also add some mixed dust particles, including dust particles, yan grass particles, fluff and paper particles for mixing test). Screen hardness test: hardness greater than class 7 (ASTM D 3363, JIS 5400) Screen impact test: hit the most vulnerable sides and center of the panel with a force of more than 5㎏  
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  • Concentrator Solar Cell Concentrator Solar Cell
    Oct 15, 2024
    Concentrator Solar Cell A concentrating solar cell is a combination of [Concentrator Photovoltaic]+[Fresnel Lenes]+[Sun Tracker]. Its solar energy conversion efficiency can reach 31% ~ 40.7%, although the conversion efficiency is high, but due to the long sunward time, it has been used in the space industry in the past, and now it can be used in the power generation industry with sunlight tracker, which is not suitable for general families. The main material of concentrating solar cells is gallium arsenide (GaAs), that is, the three five group (III-V) materials. General silicon crystal materials can only absorb the energy of 400 ~ 1,100nm wavelength in the solar spectrum, and the concentrator is different from silicon wafer solar technology, through the multi-junction compound semiconductor can absorb a wider range of solar spectrum energy, and the current development of three-junction InGaP/GaAs/Ge concentrator solar cells can greatly improve the conversion efficiency. The three-junction concentrating solar cell can absorb energy of 300 ~ 1900nm wavelength relative to its conversion efficiency can be greatly improved, and the heat resistance of concentrating solar cells is higher than that of general wafer-type solar cells.
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  • Conduction Zone of Heat Conduction Zone of Heat
    Oct 14, 2024
    Conduction Zone of Heat Thermal conductivity It is the thermal conductivity of a substance, passing from high temperature to low temperature within the same substance. Also known as: thermal conductivity, thermal conductivity, thermal conductivity, heat transfer coefficient, heat transfer, thermal conductivity, thermal conductivity, thermal conductivity, thermal conductivity. Thermal conductivity formula k = (Q/t) *L/(A*T) k: thermal conductivity, Q: heat, t: time, L: length, A: area, T: temperature difference in SI units, the unit of thermal conductivity is W/(m*K), in imperial units, is Btu · ft/(h · ft2 · °F) Heat transfer coefficient In thermodynamics, mechanical engineering and chemical engineering, the heat conductivity is used to calculate the heat conduction, mainly the heat conduction of convection or the phase transformation between fluid and solid, which is defined as the heat through the unit area per unit time under the unit temperature difference, called the heat conduction coefficient of the substance, if the thickness of the mass of L, the measurement value to be multiplied by L, The resulting value is the coefficient of thermal conductivity, usually denoted as k. Unit conversion of heat conduction coefficient 1 (CAL) = 4.186 (j), 1 (CAL/s) = 4.186 (j/s) = 4.186 (W). The impact of high temperature on electronic products: The rise in temperature will cause the resistance value of the resistor to decrease, but also shorten the service life of the capacitor, in addition, the high temperature will cause the transformer, the performance of the related insulation materials to decrease, the temperature is too high will also cause the solder joint alloy structure on the PCB board to change: IMC thickens, solder joints become brittle, tin whisker increases, mechanical strength decreases, junction temperature increases, the current amplification ratio of transistor increases rapidly, resulting in collector current increases, junction temperature further increases, and finally component failure. Explanation of proper terms: Junction Temperature: The actual temperature of a semiconductor in an electronic device. In operation, it is usually higher than the Case Temperature of the package, and the temperature difference is equal to the heat flow multiplied by the thermal resistance. Free convection (natural convection) : Radiation (radiation) : Forced Air(gas cooling) : Forced Liquid (gas cooling) : Liquid Evaporation: Surface Surroundings Surroundings Common simple considerations for thermal design: 1 Simple and reliable cooling methods such as heat conduction, natural convection and radiation should be used to reduce costs and failures. 2 Shorten the heat transfer path as much as possible, and increase the heat exchange area. 3 When installing components, the influence of radiation heat exchange of peripheral components should be fully considered, and the thermal sensitive devices should be kept away from the heat source or find a way to use the protective measures of the heat shield to isolate the components from the heat source. 4 There should be sufficient distance between the air inlet and the exhaust port to avoid hot air reflux. 5 The temperature difference between the incoming air and the outgoing air should be less than 14 ° C. 6 It should be noted that the direction of forced ventilation and natural ventilation should be consistent as far as possible. 7 Devices with large heat should be installed as close as possible to the surface that is easy to dissipate heat (such as the inner surface of the metal casing, metal base and metal bracket, etc.), and there is good contact heat conduction between the surface. 8 Power supply part of the high-power tube and rectifier bridge pile belong to the heating device, it is best to install directly on the housing to increase the heat dissipation area. In the layout of the printed board, more copper layers should be left on the board surface around the larger power transistor to improve the heat dissipation capacity of the bottom plate. 9 When using free convection, avoid using heat sinks that are too dense. 10 The thermal design should be considered to ensure that the current carrying capacity of the wire, the diameter of the selected wire must be suitable for the conduction of the current, without causing more than the allowable temperature rise and pressure drop. 11 If the heat distribution is uniform, the spacing of the components should be uniform to make the wind flow evenly through each heat source. 12 When using forced convection cooling (fans), place the temperature-sensitive components closest to the air intake. 13 The use of free convection cooling equipment to avoid arranging other parts above the high power consumption parts, the correct approach should be uneven horizontal arrangement. 14 If the heat distribution is not uniform, the components should be sparsely arranged in the area with large heat generation, and the component layout in the area with small heat generation should be slightly denser, or add a diversion bar, so that the wind energy can effectively flow to the key heating devices. 15 The structural design principle of the air inlet: on the one hand, try to minimize its resistance to the air flow, on the other hand, consider dust prevention, and comprehensively consider the impact of the two. 16 Power consumption components should be spaced as far apart as possible. 17 Avoid crowding temperature sensitive parts together or arranging them next to high power consuming parts or hot spots. 18 The use of free convection cooling equipment to avoid arranging other parts above the high power consumption parts, the correct practice should be uneven horizontal arrangement.
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  • Temperature Cyclic Stress Screening (2) Temperature Cyclic Stress Screening (2)
    Oct 14, 2024
    Temperature Cyclic Stress Screening (2) Introduction of stress parameters for temperature cyclic stress screening: The stress parameters of temperature cyclic stress screening mainly include the following: high and low temperature extremum range, dwell time, temperature variability, cycle number High and low temperature extremal range: the larger the range of high and low temperature extremal, the fewer cycles required, the lower the cost, but can not exceed the product can withstand the limit, do not cause new fault principle, the difference between the upper and lower limits of temperature change is not less than 88°C, the typical range of change is -54°C to 55°C. Dwell time: In addition, the dwell time can not be too short, otherwise it is too late to make the product under test produce thermal expansion and contraction stress changes, as for the dwell time, the dwell time of different products is different, you can refer to the relevant specification requirements. Number of cycles: As for the number of cycles of temperature cyclic stress screening, it is also determined by considering product characteristics, complexity, upper and lower limits of temperature and screening rate, and the screening number should not be exceeded, otherwise it will cause unnecessary harm to the product and cannot improve the screening rate. The number of temperature cycles ranges from 1 to 10 cycles [ordinary screening, primary screening] to 20 to 60 cycles [precision screening, secondary screening], for the removal of the most likely workmanship defects, about 6 to 10 cycles can be effectively removed, in addition to the effectiveness of the temperature cycle, Mainly depends on the temperature variation of the product surface, rather than the temperature variation inside the test box. There are seven main influencing parameters of temperature cycle: (1) Temperature Range (2) Number of Cycles (3) Temperature Rate of Chang (4) Dwell Time (5) Airflow Velocities (6) Uniformity of Stress (7) Function test or not (Product Operating Condition) Stress screening fatigue classification: The general classification of Fatigue research can be divided into High-cycle Fatigue, Low-cycle Fatigue and Fatigue Crack Growth. In the aspect of low cycle Fatigue, it can be subdivided into Thermal Fatigue and Isothermal Fatigue. Stress screening acronyms: ESS: Environmental stress screening FBT: Function board tester ICA: Circuit analyzer ICT: Circuit tester LBS: load board short-circuit tester MTBF: mean time between failures Time of temperature cycles: a.MIL-STD-2164(GJB 1302-90) : In the defect removal test, the number of temperature cycles is 10, 12 times, and in the trouble-free detection it is 10 ~ 20 times or 12 ~ 24 times. In order to remove the most likely workmanship defects, about 6 ~ 10 cycles are needed to effectively remove them. 1 ~ 10 cycles [general screening, primary screening], 20 ~ 60 cycles [precision screening, secondary screening]. B.od-hdbk-344 (GJB/DZ34) Initial screening equipment and unit level uses 10 to 20 loops (usually ≧10), component level uses 20 to 40 loops (usually ≧25). Temperature variability: a.MIL-STD-2164(GJB1032) clearly states: [Temperature change rate of temperature cycle 5℃/min] B.od-hdbk-344 (GJB/DZ34) Component level 15 ° C /min, system 5 ° C /min c. Temperature cyclic stress screening is generally not specified temperature variability, and its commonly used degree variation rate is usually 5°C/min
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  • IEC-60068-2 Combined Test of Condensation and Temperature and Humidity IEC-60068-2 Combined Test of Condensation and Temperature and Humidity
    Oct 14, 2024
    IEC-60068-2 Combined Test of Condensation and Temperature and Humidity Difference of IEC60068-2 damp heat test specifications In the IEC60068-2 specification, there are a total of five kinds of humid heat tests, in addition to the common 85℃/85%R.H., 40℃/93%R.H. In addition to fixed-point high temperature and high humidity, there are two more special tests [IEC60068-2-30, IEC60068-2-38], these two are alternating wet and humid cycle and temperature and humidity combined cycle, so the test process will change temperature and humidity, and even multiple groups of program links and cycles, applied in IC semiconductors, parts, equipment, etc. To simulate the outdoor condensation phenomenon, evaluate the material's ability to prevent water and gas diffusion, and accelerate the product's tolerance to deterioration, the five specifications were organized into a comparison table of the differences in the wet and heat test specifications, and the test points were explained in detail for the wet and heat combined cycle test, and the test conditions and points of GJB in the wet and heat test were supplemented. IEC60068-2-30 alternating humid heat cycle test This test uses the test technique of maintaining humidity and temperature alternating to make moisture penetrate into the sample and cause condensation (condensation) on the surface of the product to be tested, so as to confirm the adaptability of the component, equipment or other products in use, transportation and storage under the combination of high humidity and temperature and humidity cyclic changes. This specification is also suitable for large test samples. If the equipment and the test process need to keep the power heating components for this test, the effect will be better than IEC60068-2-38, the high temperature used in this test has two (40 ° C, 55 ° C), the 40 ° C is to meet most of the world's high temperature environment, while 55 ° C meets all the world's high temperature environment, the test conditions are also divided into [cycle 1, cycle 2], In terms of severity, [Cycle 1] is higher than [Cycle 2]. Suitable for side products: components, equipment, various types of products to be tested Test environment: the combination of high humidity and temperature cyclic changes produces condensation, and three kinds of environments can be tested [use, storage, transportation ([packaging is optional)] Test stress: Breathing causes water vapor to invade Whether power is available: Yes Not suitable for: parts that are too light and too small Test process and post-test inspection and observation: check the electrical changes after moisture [do not take out the intermediate inspection] Test conditions: Humidity: 95%R.H.[Temperature change after high humidity maintenance](low temperature 25±3℃←→ high temperature 40℃ or 55℃) Rising and cooling rate: heating (0.14℃/min), cooling (0.08 ~ 0.16℃/min) Cycle 1: Where absorption and respiratory effects are important features, the test sample is more complex [humidity not less than 90%R.H.] Cycle 2: In the case of less obvious absorption and respiratory effects, the test sample is simpler [humidity is not less than 80%R.H.] IEC60068-2 damp heat test specification difference comparison table For component type parts products, a combination test method is used to accelerate the confirmation of the test sample's resistance to degradation under high temperature, high humidity and low temperature conditions. This test method is different from the product defects caused by respiration [dew, moisture absorption] of IEC60068-2-30. The severity of this test is higher than that of other humid heat cycle tests, because there are more temperature changes and [respiration] during the test, the cycle temperature range is larger [from 55℃ to 65℃], and the temperature change rate of the temperature cycle is faster [temperature rise: 0.14 ° C /min becomes 0.38 ° C /min, 0.08 ° C /min becomes 1.16 ° C /min], in addition, different from the general humid heat cycle, the low temperature cycle condition of -10 ° C is added to accelerate the breathing rate and make the water condensed in the gap of the substitute freeze, which is the characteristic of this test specification. The test process allows the power test and the applied load power test, but it can not affect the test conditions (temperature and humidity fluctuation, rising and cooling rate) because of the heating of the side product after power. Due to the change of temperature and humidity during the test process, there can not be condensation water droplets on the top of the test chamber to the side product. Suitable for side products: components, metal components sealing, lead end sealing Test environment: combination of high temperature, high humidity and low temperature conditions Test stress: accelerated breathing + frozen water Whether it can be powered on: it can be powered on and external electric load (it can not affect the conditions of the test chamber because of power heating) Not applicable: Can not replace moist heat and alternating humid heat, this test is used to produce defects different from respiration Test process and post-test inspection and observation: check the electrical changes after moisture [check under high humidity conditions and take out after test] Test conditions: damp heat cycle (25 please - 65 + 2 ℃ / 93 + / - 3% R.H.) please - low temperature cycle (25 please - 65 + 2 ℃ / 93 + 3% R.H. - - 10 + 2 ℃) X5cycle = 10 cycle Rising and cooling rate: heating (0.38℃/min), cooling (1.16 ℃/min) Heat and humidity cycle (25←→65±2℃/93±3%R.H.) Low temperature cycle (25←→65±2℃/93±3%R.H. →-10±2℃) GJB150-09 damp heat test Instructions: The wet and heat test of GJB150-09 is to confirm the ability of equipment to withstand the influence of hot and humid atmosphere, suitable for equipment stored and used in hot and humid environments, equipment prone to high humidity, or equipment that may have potential problems related to heat and humidity. Hot and humid locations can occur throughout the year in the tropics, seasonally in mid-latitudes, and in equipment subjected to combined pressure, temperature and humidity changes, with special emphasis on 60 ° C /95%R.H. This high temperature and humidity does not occur in nature, nor does it simulate the dampness and heat effect after solar radiation, but it can find the parts of the equipment with potential problems, but it cannot reproduce the complex temperature and humidity environment, evaluate the long-term effect, and can not reproduce the humidity impact related to the low humidity environment. Relevant equipment for condensation, wet freezing, wet heat combined cycle test: constant temperature and humidity test chamber
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