Two zone Thermal Test Chamber
【Introduction】
Environmental conditions have a great influence on the functionality and reliability of the electronic components, devices and systems. A normal temperature test is often not sufficient to detect latent weak points as quickly as possible. Samples must be subjected to multiple, shock like temperature changes. With thermal shock test chamber extremely fast temperature changes from –55 °C to +150 °C can be achieved. This helps you to reduce early failures and to increase the reliability of your products. Reproducible, certified and under accelerated conditions.
【Test Standard】
IEC 60068-2-14 Na
MIL-STD-810H, Method 503.7
MIL-STD-883L-1, Method 1010.9
JASO D 014-4
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