Lab-companion Secures Patent for Semiconductor Environmental Testing Innovation

*Beijing, March 3, 2025* – The China National Intellectual Property Administration (CNIPA) has issued a notification granting a patent for an invention titled "A High-Low Temperature Testing Equipment for Semiconductor Chip Detection and Its Operation Method" to Guangdong Hongzhan Technology Co., Ltd.(Lab-Companion). The patent application, filed under the number 202411290322.4, has successfully passed the substantive examination process, confirming that there are no grounds for rejection.

The invention, developed by Lab-Companion, is designed to address the growing demand for precise and reliable testing of semiconductor chips under extreme temperature conditions. The high-low temperature testing equipment is expected to enhance the accuracy and efficiency of semiconductor chip detection, which is critical for the development of advanced electronic devices.

The adoption of this patent opens up a new direction and method for semiconductor environmental testing, provides new technical support for the environmental testing of semiconductor chips, helps standardize the operating process of environmental testing in this industry, and enables related enterprises to get better development.

This patent grant underscores China's responsibility to fostering innovation in the semiconductor industry, a sector that plays a pivotal role in the global technology landscape. The high-low temperature and humid testing chamber is poised to make significant contributions to the semiconductor manufacturing process, ensuring the reliability and performance of chips used in various applications, from consumer electronics to industrial machinery.

Our company is always dedicated to the research and development of environmental testing, to provide advanced environmental testing solutions for various industries and meet the evolving needs of the global electronics market.