GUANGDONG LABCOMPANION Ltd. Through a New Patent in Semiconductor Testing with High-Low Temperature Test Chamber.

Dongguan, China –April 2, 2025 –Lab Companion, a leading innovator in environmental testing solutions, has been granted a groundbreaking patent for its advanced high-low temperature test chamber designed for semiconductor chip detection. The patent, officially issued by the China National Intellectual Property Administration on April 1, 2025 (Patent No. ZL 2024 1 1290322.4), marks a significant milestone in the company’s commitment to precision and reliability in industrial testing.  

Revolutionizing Semiconductor Testing

The newly patented technology, introduces a cutting-edge system capable of subjecting semiconductor chips to extreme temperature variations with unparalleled accuracy. This innovation addresses critical challenges in the semiconductor industry, where precise thermal testing is essential for ensuring chip durability and performance under diverse operating conditions. 

Standard Parameters for Environmental Testing of Semiconductor Chips

1. Temperature Testing

- Temperature Range:  

  - Operating Range: -40°C to +125°C (common for industrial-grade chips)  

  - Extended Range: -65°C to +150°C (for military/aerospace applications)  

- Thermal Cycling:  

  - Rate of Change: 5°C/min to 20°C/min (depending on test standards)  

  - Dwell Time: 10–30 minutes at extreme temperatures (to stabilize conditions)  

  - Cycles: 100–1,000 cycles (per JEDEC, MIL-STD, or AEC-Q100)

2. Humidity Testing  

- Relative Humidity (RH): 85%–95% RH  

- Temperature: 85°C (commonly used in "85/85" testing for accelerated aging)  

- Duration: 500–1,000 hours (per JESD22-A101)  

3. Thermal Shock Testing  

- Temperature Extremes: -55°C to +125°C (per MIL-STD-883G Method 1011)  

- Transition Time: <1 minute (liquid-to-liquid) or <5 minutes (air-to-air)  

- Cycles: 50–500 cycles  

4. Vibration and Mechanical Stress  

- Frequency Range: 5 Hz–2 kHz (per MIL-STD-883)  

-Acceleration: 5–20 G (depending on application)

5. Other Critical Standards  

- JEDEC Standards (e.g., JESD22-A104 for thermal cycling)  

- AEC-Q100: Automotive-grade chip qualification  

- MIL-STD-883: Military/defense reliability testing  

- IEC 60068: General environmental testing guidelines  

These parameters ensure semiconductor chips meet industry requirements for performance under extreme conditions. Specific values may vary based on application (e.g., consumer electronics vs. automotive).  

Note: Always refer to the latest version of relevant standards (JEDEC, AEC, MIL-STD, etc.) for precise testing protocols.

“Our optimized testing parameters push beyond traditional standards in three critical ways. First, we’ve expanded the temperature range to -70℃ to +175℃—far wider than the typical -40℃ to +125℃—to meet demands for power electronics and aerospace applications. Second, we accelerated thermal cycling rates to 30℃/min, slashing test time by half while maintaining precision, unlike the conventional 5–20℃/min approach. Third, we integrated multi-axis vibration (up to 50G) with extreme thermal shocks (-65℃↔+175℃in under 30 seconds), a combination rarely addressed in older standards like JEDEC or MIL-STD. These upgrades don’t just test chips; they future-proof them.” CEO said.

“This patent underscores our dedication to pushing the boundaries of testing technology,” said a spokesperson form LabCompanion. “Our high-low temperature test chamber not only enhances efficiency but also sets a new standard for reliability in semiconductor quality control. 

Key Features and Advantages  

- Precision Control: The equipment offers precise temperature regulation, enabling rigorous testing across a wide range of thermal conditions.  

- Enhanced Durability: Designed to withstand repeated thermal cycles, the system ensures long-term stability and accuracy.  

- User-Friendly Operation: The accompanying methodology simplifies complex testing procedures, making it accessible for industrial applications.

At the forefront of environmental test chamber technology, we combine constant innovation with market insights to develop advanced testing solutions for every industry. Market-proven through exceptional quality and service, we're motivated by your choice to push boundaries further every day.

For more information about temperature test equipment, visit [High and low temperature test chamber] .